Publication:

Proton irradiation effects in silicon junction diodes and charge-coupled devices

Date

1997
Journal article
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorAlaerts, André
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSunaga, H.
dc.contributor.authorNahsiyama, I.
dc.contributor.authorSkorupa, W.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-30T09:33:26Z
dc.date.available2021-09-30T09:33:26Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2147
dc.source.beginpage417
dc.source.endpage422
dc.source.issue5
dc.source.journalRadiation Physics and Chemistry
dc.source.volume50
dc.title

Proton irradiation effects in silicon junction diodes and charge-coupled devices

dc.typeJournal article
dspace.entity.typePublication
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