Publication:

Performance enhancement for multi gate tunneling field effect transistors by scaling the fin-width

Date

 
dc.contributor.authorLeonelli, Daniele
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVerhulst, Anne
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorHeyns, Marc
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorLeonelli, Daniele
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-18T18:09:54Z
dc.date.available2021-10-18T18:09:54Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17469
dc.source.beginpage04DC10
dc.source.issue4
dc.source.journalJapanese Journal of Applied Physics
dc.source.volume49
dc.title

Performance enhancement for multi gate tunneling field effect transistors by scaling the fin-width

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
20071.pdf
Size:
580.49 KB
Format:
Adobe Portable Document Format
Publication available in collections: