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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Publication:
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Cretu, Bogdan
;
Fang, Wen
;
Aoulaiche, Marc
;
Routoure, Jean-Marc
;
Carin, Regis
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
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1936
since deposited on 2021-10-23
430
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Acq. date: 2025-10-25
Citations
Metrics
Views
1936
since deposited on 2021-10-23
430
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations