Publication:

Electrical activity of extended defects in III-V semiconductors

Date

2019
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorHsu, Brent
dc.contributor.authorMols, Yves
dc.contributor.authorKunert, Bernardette
dc.contributor.authorLanger, Robert
dc.contributor.authorMerckling, Clement
dc.contributor.authorAlian, AliReza
dc.contributor.authorWaldron, Niamh
dc.contributor.authorEneman, Geert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorKunert, Bernardette
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecKunert, Bernardette::0000-0002-8986-4109
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-27T18:21:39Z
dc.date.available2021-10-27T18:21:39Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34008
dc.identifier.urlhttp://ecst.ecsdl.org/content/92/4/21.abstract
dc.source.beginpage21
dc.source.conferenceSemiconductor Process Integration 11
dc.source.conferencedate13/10/2019
dc.source.conferencelocationAtlanta, GA USA
dc.source.endpage31
dc.title

Electrical activity of extended defects in III-V semiconductors

dc.typeProceedings paper
dspace.entity.typePublication
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