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Stress in silicon due to the formation of self aligned poly-CoSi2 lines studied by micro-Raman spectroscopy
Publication:
Stress in silicon due to the formation of self aligned poly-CoSi2 lines studied by micro-Raman spectroscopy
Date
1996
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Howard, Dave
;
De Wolf, Ingrid
;
Bender, Hugo
;
Maex, Karen
Journal
Abstract
Description
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1909
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1909
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-08
Citations