Publication:

Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs

Date

2017
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorKilchytska, Valeria
dc.contributor.authorKazemi Esfeh, Babak
dc.contributor.authorGimeno, C.
dc.contributor.authorParvais, Bertrand
dc.contributor.authorPlanes, N.
dc.contributor.authorHaond, M.
dc.contributor.authorRaskin, J-P
dc.contributor.authorFlandre, Denis
dc.contributor.imecauthorKazemi Esfeh, Babak
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.date.accessioned2021-10-24T06:54:16Z
dc.date.available2021-10-24T06:54:16Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28678
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7962578/
dc.source.beginpage128
dc.source.conferenceJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate3/04/2017
dc.source.conferencelocationAthens Greece
dc.source.endpage131
dc.title

Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
35583.pdf
Size:
1.22 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions