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Controlling surface-enhanced charge screening to realize single-molecule sensing with silicon FET sensors

Date

2020
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dc.contributor.authorSantermans, Sybren
dc.contributor.authorMartens, Koen
dc.contributor.imecauthorSantermans, Sybren
dc.contributor.imecauthorMartens, Koen
dc.contributor.orcidimecSantermans, Sybren::0000-0002-0843-102X
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.thesisadvisorHeyns, Marc
dc.date.accessioned2021-10-29T03:37:59Z
dc.date.available2021-10-29T03:37:59Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35893
dc.source.conferenceSingle-Molecule Sensors and nanoSystems International Conference S3IC
dc.source.conferencedate9/11/2020
dc.source.conferencelocationBarcelona Spain
dc.title

Controlling surface-enhanced charge screening to realize single-molecule sensing with silicon FET sensors

dc.typeMeeting abstract
dspace.entity.typePublication
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