Publication:

On-wafer human metal model measurements for system-level ESD analysis

Date

2009-09
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorScholz, Mirko
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThijs, Steven
dc.contributor.authorSawada, Masanori
dc.contributor.authorNakaei, T.
dc.contributor.authorHasebe, Takumi
dc.contributor.authorLafonteese, David
dc.contributor.authorVashchenko, Vladislav
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorHopper, P.
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.accessioned2021-10-18T02:44:14Z
dc.date.available2021-10-18T02:44:14Z
dc.date.embargo9999-12-31
dc.date.issued2009-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16177
dc.source.beginpage5B.4
dc.source.conference31st Annual EOS/ESD Symposium
dc.source.conferencedate30/08/2009
dc.source.conferencelocationAnaheim, CA USA
dc.title

On-wafer human metal model measurements for system-level ESD analysis

dc.typeMeeting abstract
dspace.entity.typePublication
Files

Original bundle

Name:
17850.pdf
Size:
481.09 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions