Publication:

Ultra-thin gate oxide breakdown

Date

1996
Journal article
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dc.contributor.authorDepas, Michel
dc.contributor.authorHeyns, Marc
dc.contributor.authorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMertens, Paul
dc.date.accessioned2021-09-29T14:26:53Z
dc.date.available2021-09-29T14:26:53Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1202
dc.source.beginpage45
dc.source.endpage46
dc.source.issue3
dc.source.journalEuropean Semiconductor
dc.source.volume19
dc.title

Ultra-thin gate oxide breakdown

dc.typeJournal article
dspace.entity.typePublication
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