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DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM
Publication:
DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM
Date
2012-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deutsch, Sergej
;
Keller, Brion
;
Chickermane, Vivek
;
Goel, Sandeep K.
;
Marinissen, Erik Jan
Journal
Abstract
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1900
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1900
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations