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Surface redeposition and damage due to focused ion beam milling
Publication:
Surface redeposition and damage due to focused ion beam milling
Date
2015
Presentation
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32399.pdf
395.33 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bender, Hugo
;
Franquet, Alexis
;
Drijbooms, Chris
;
Parmentier, Brigitte
;
Vandervorst, Wilfried
;
Kwakman, Laurens
Journal
Abstract
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1966
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations
Metrics
Views
1966
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations