Publication:

Transient voltage overshoot in TLP testing - real or artifact

Date

2005
Proceedings Paper
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dc.contributor.authorTremouilles, David
dc.contributor.authorThijs, Steven
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-16T05:48:41Z
dc.date.available2021-10-16T05:48:41Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11335
dc.source.beginpage152
dc.source.conferenceProceedings 27nd EOS/ESD Symposium
dc.source.conferencedate11/09/2005
dc.source.conferencelocationAnaheim, CA California
dc.source.endpage160
dc.title

Transient voltage overshoot in TLP testing - real or artifact

dc.typeProceedings paper
dspace.entity.typePublication
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