Publication:
Understanding the Role of Shape Imperfections on the Bit Error Rates of STT-MRAM Under External Magnetic Fields
| dc.contributor.author | Ahirwar, Sonalie | |
| dc.contributor.author | Kumar, Ankit | |
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Arya, Susheel Kumar | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Wostyn, Kurt | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.author | Pramanik, Tanmoy | |
| dc.contributor.imecauthor | Kumar, Ankit | |
| dc.contributor.imecauthor | Beek, Simon Van | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Wostyn, Kurt | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Kumar, Ankit::0000-0002-1168-3287 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Wostyn, Kurt::0000-0003-3995-0292 | |
| dc.date.accessioned | 2025-08-03T03:58:24Z | |
| dc.date.available | 2025-08-03T03:58:24Z | |
| dc.date.issued | 2025-JUL 25 | |
| dc.description.wosFundingText | This work was supported in part by the Science and Engineering Research Board, Government of India, under Grant SRG/2021/000377; in part by the Faculty Initiation Grant, IIT Roorkee; in part by the Supercomputing Facility of IIT Roorkee through the National Supercomputing Mission, Government of India; in part by the Interuniversity Microelectronics Centre (IMEC) Industrial Affiliation Program on Magnetic Random-Access Memory (MRAM) Devices; and in part by the Cyber Security Research Flanders under Grant VR20192203. | |
| dc.identifier.doi | 10.1109/TED.2025.3589985 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/46018 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 4890 | |
| dc.source.endpage | 4895 | |
| dc.source.issue | 9 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 5 | |
| dc.source.volume | 72 | |
| dc.title | Understanding the Role of Shape Imperfections on the Bit Error Rates of STT-MRAM Under External Magnetic Fields | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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