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Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

Date

2018-06
Proceedings Paper
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dc.contributor.authorFodor, Ferenc
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorAcconcia, Daniele
dc.contributor.authorVallauri, Raffaele
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2021-10-25T18:42:12Z
dc.date.available2021-10-25T18:42:12Z
dc.date.issued2018-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30716
dc.identifier.urlhttp://www.swtest.org/swtw_library/2018proc/PDF/S02_03_Fodor_SWTW2018.pdf
dc.source.conferenceSemiconductor Wafer Test Workshop - SWTW
dc.source.conferencedate3/06/2018
dc.source.conferencelocationSan Diego, CA USA
dc.title

Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

dc.typeProceedings paper
dspace.entity.typePublication
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