Publication:
Mapping interfacial excess in atom probe data
Date
| dc.contributor.author | Felfer, Peter | |
| dc.contributor.author | Scherrer, Barbara | |
| dc.contributor.author | Demeulemeester, Jelle | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.author | Cairney, Julie M. | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-22T19:14:17Z | |
| dc.date.available | 2021-10-22T19:14:17Z | |
| dc.date.issued | 2015 | |
| dc.identifier.issn | 0304-3991 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25267 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0304399115001369 | |
| dc.source.beginpage | 438 | |
| dc.source.endpage | 444 | |
| dc.source.issue | Part B | |
| dc.source.journal | Ultramicroscopy | |
| dc.source.volume | 159 | |
| dc.title | Mapping interfacial excess in atom probe data | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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