Publication:
Ferroelectric FET with Gd-doped HfO2: A Step Towards Better Uniformity and Improved Memory Performance
| dc.contributor.author | Ronchi, Nicolo | |
| dc.contributor.author | Ragnarsson, Lars-Ake | |
| dc.contributor.author | Breuil, Laurent | |
| dc.contributor.author | Banerjee, Kaustuv | |
| dc.contributor.author | McMitchell, Sean | |
| dc.contributor.author | O'Sullivan, Barry | |
| dc.contributor.author | Milenin, Alexey | |
| dc.contributor.author | Kundu, Shreya | |
| dc.contributor.author | Pak, Murat | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Ronchi, Nicolo | |
| dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
| dc.contributor.imecauthor | Breuil, Laurent | |
| dc.contributor.imecauthor | Banerjee, Kaustuv | |
| dc.contributor.imecauthor | McMitchell, Sean | |
| dc.contributor.imecauthor | O'Sullivan, Barry | |
| dc.contributor.imecauthor | Milenin, Alexey | |
| dc.contributor.imecauthor | Kundu, Shreya | |
| dc.contributor.imecauthor | Pak, Murat | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
| dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
| dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
| dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
| dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
| dc.contributor.orcidimec | Milenin, Alexey::0000-0003-0747-0462 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
| dc.date.accessioned | 2022-03-14T11:58:34Z | |
| dc.date.available | 2022-03-14T11:58:34Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/SNW51795.2021.00012 | |
| dc.identifier.eisbn | 978-4-86348-781-9 | |
| dc.identifier.issn | 2161-4636 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39445 | |
| dc.publisher | IEEE, ELECTRON DEVICES SOC & RELIABILITY GROUP | |
| dc.source.beginpage | 21 | |
| dc.source.conference | 26th Silicon Nanoelectronics Workshop | |
| dc.source.conferencedate | JUN 13, 2021 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.endpage | 22 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 2 | |
| dc.title | Ferroelectric FET with Gd-doped HfO2: A Step Towards Better Uniformity and Improved Memory Performance | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |