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A high resolution method for measuring hot carrier degradation in matched transistor pairs
Publication:
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Date
1997
Proceedings Paper
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1841.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dreesen, R.
;
De Ceuninck, Ward
;
De Schepper, Luc
;
Groeseneken, Guido
Journal
Abstract
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1921
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations
Metrics
Views
1921
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations