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Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
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1947 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-06
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Metrics
Views
1947 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-06
Citations