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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors

 
dc.contributor.authorGrill, Alexander
dc.contributor.authorJohn, Valentin
dc.contributor.authorMichl, J.
dc.contributor.authorBeckers, Arnout
dc.contributor.authorBury, Erik
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorParvais, Bertrand
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorGrasser, T.
dc.contributor.authorWaltl, M.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorJohn, Valentin
dc.contributor.imecauthorBeckers, Arnout
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecBeckers, Arnout::0000-0003-3663-0824
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGovoreanu, Bogdan::0000-0001-7210-2979
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.date.accessioned2023-06-02T07:35:24Z
dc.date.available2023-02-27T03:28:49Z
dc.date.available2023-06-02T07:35:24Z
dc.date.issued2022
dc.description.wosFundingTextThis work is funded in part by imec's Industrial Affiliation Program on Quantum Computing and Cryoelectronics. Furthermore, the financial support by the Austrian Federal Ministry for Digital and Economic Affairs, the National Foundation for Research, Technology and Development and the Christian Doppler Research Association is gratefully acknowledged.
dc.identifier.doi10.1109/IRPS48227.2022.9764594
dc.identifier.eisbn978-1-6654-7950-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41190
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
dc.source.numberofpages6
dc.title

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors

dc.typeProceedings paper
dspace.entity.typePublication
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