Publication:
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | John, Valentin | |
| dc.contributor.author | Michl, J. | |
| dc.contributor.author | Beckers, Arnout | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Grasser, T. | |
| dc.contributor.author | Waltl, M. | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Govoreanu, Bogdan | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | John, Valentin | |
| dc.contributor.imecauthor | Beckers, Arnout | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Govoreanu, Bogdan | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | Beckers, Arnout::0000-0003-3663-0824 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Govoreanu, Bogdan::0000-0001-7210-2979 | |
| dc.contributor.orcidimec | Tyaginov, Stanislav::0000-0002-5348-2096 | |
| dc.date.accessioned | 2023-06-02T07:35:24Z | |
| dc.date.available | 2023-02-27T03:28:49Z | |
| dc.date.available | 2023-06-02T07:35:24Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work is funded in part by imec's Industrial Affiliation Program on Quantum Computing and Cryoelectronics. Furthermore, the financial support by the Austrian Federal Ministry for Digital and Economic Affairs, the National Foundation for Research, Technology and Development and the Christian Doppler Research Association is gratefully acknowledged. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764594 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41190 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.title | Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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