Alternative EUV mask technology for mask 3D effect compensation

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Author(s)

Van Look, Lieve

;

Philipsen, Vicky

;

Hendrickx, Eric

;

Vandenberghe, Geert

;

;

Davydova, Natalia

;

Wittebrood, Friso

;

De Kruif, Robert

;

Van Oosten, Anton

;

Fliervoet, Timon

;

Van Schoot, Jan

;

Neumann, Jens Timo

Metrics

1904 since deposited on 2021-10-22

Acq. date: 2025-10-24