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Measurement and analysis of parasitic capacitance in FinFETs with high-k dielectrics and metal-gate stack
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1910 since deposited on 2021-10-17
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Acq. date: 2026-04-05
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Statistics
Views
1910 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-04-05
Citations