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Conference contributions
Multivariate analysis of a 100-nm process measured by in-line scatterometry
Publication:
Multivariate analysis of a 100-nm process measured by in-line scatterometry
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Date
2004
Proceedings Paper
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8848.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Egret, S.
;
Furusho, Tetsunari
;
Baudemprez, Bart
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1914
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
Metrics
Views
1914
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations