Publication:

Two-Regime Drift in Electrolytically Gated FETs and BioFETs

Date

2020
Proceedings Paper
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dc.contributor.authorWuytens, Robin
dc.contributor.authorSantermans, Sybren
dc.contributor.authorGupta, Mihir
dc.contributor.authorDu Bois, Bert
dc.contributor.authorSeveri, Simone
dc.contributor.authorLagae, Liesbet
dc.contributor.authorVan Roy, Wim
dc.contributor.authorMartens, Koen
dc.contributor.imecauthorWuytens, R.
dc.contributor.imecauthorSantermans, Sybren
dc.contributor.imecauthorGupta, Mihir
dc.contributor.imecauthorDu Bois, Bert
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorMartens, Koen
dc.contributor.orcidimecSantermans, Sybren::0000-0002-0843-102X
dc.contributor.orcidimecGupta, Mihir::0000-0003-0286-7997
dc.contributor.orcidimecDu Bois, Bert::0000-0003-0147-1296
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecLagae, Liesbet::0000-0002-1611-6441
dc.date.accessioned2021-11-23T11:11:41Z
dc.date.available2021-11-02T16:05:23Z
dc.date.available2021-11-23T11:11:41Z
dc.date.issued2020
dc.identifier.eisbn978-1-7281-3199-3
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38213
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationDallas, TX, USA
dc.source.journalna
dc.source.numberofpages5
dc.title

Two-Regime Drift in Electrolytically Gated FETs and BioFETs

dc.typeProceedings paper
dspace.entity.typePublication
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