Publication:
Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology
| dc.contributor.author | Yadav, Sachin | |
| dc.contributor.author | Cardinael, Pieter | |
| dc.contributor.author | Zhao, Ming | |
| dc.contributor.author | Vondkar Kodandarama, Komal | |
| dc.contributor.author | Khaled, Ahmad | |
| dc.contributor.author | Rodriguez, Raul | |
| dc.contributor.author | Vermeersch, Bjorn | |
| dc.contributor.author | Makovejev, S. | |
| dc.contributor.author | Ekoga, E. | |
| dc.contributor.author | Pottrain, A. | |
| dc.contributor.author | Waldron, Niamh | |
| dc.contributor.author | Raskin, J.-P. | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.imecauthor | Yadav, S. | |
| dc.contributor.imecauthor | Zhao, M. | |
| dc.contributor.imecauthor | Vondkar, K. | |
| dc.contributor.imecauthor | Khaled, A. | |
| dc.contributor.imecauthor | Rodriguez, R. | |
| dc.contributor.imecauthor | Vermeersch, B. | |
| dc.contributor.imecauthor | Waldron, N. | |
| dc.contributor.imecauthor | Parvais, B. | |
| dc.contributor.imecauthor | Collaert, N. | |
| dc.contributor.imecauthor | Yadav, Sachin | |
| dc.contributor.imecauthor | Cardinael, Pieter | |
| dc.contributor.imecauthor | Zhao, Ming | |
| dc.contributor.imecauthor | Vondkar Kodandarama, Komal | |
| dc.contributor.imecauthor | Khaled, Ahmad | |
| dc.contributor.imecauthor | Rodriguez, Raul | |
| dc.contributor.imecauthor | Vermeersch, Bjorn | |
| dc.contributor.imecauthor | Waldron, Niamh | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Zhao, Ming::0000-0002-0856-851X | |
| dc.contributor.orcidimec | Khaled, Ahmad::0000-0003-2892-3176 | |
| dc.contributor.orcidimec | Rodriguez, Raul::0000-0002-4457-8942 | |
| dc.contributor.orcidimec | Vermeersch, Bjorn::0000-0001-8640-672X | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2021-12-15T11:13:47Z | |
| dc.date.available | 2021-12-06T02:06:36Z | |
| dc.date.available | 2021-12-15T11:13:47Z | |
| dc.date.issued | 2020 | |
| dc.identifier.doi | 10.1109/IEDM13553.2020.9371893 | |
| dc.identifier.eisbn | 978-1-7281-8888-1 | |
| dc.identifier.issn | 2380-9248 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38551 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 159 | |
| dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
| dc.source.conferencedate | DEC 12-18, 2020 | |
| dc.source.conferencelocation | San Francisco, CA, USA | |
| dc.source.endpage | 162 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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