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Articles
Improved thermal fatigue reliability for flip chip assemblies using redistribution techniques
Publication:
Improved thermal fatigue reliability for flip chip assemblies using redistribution techniques
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Date
2000
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandevelde, Bart
;
Beyne, Eric
Journal
IEEE Trans. Advanced Packaging
Abstract
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1890
since deposited on 2021-10-14
3
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Acq. date: 2025-12-15
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Metrics
Views
1890
since deposited on 2021-10-14
3
last month
Acq. date: 2025-12-15
Citations