Publication:

Insights into the reliability of Ni/Cu plated p-PERC silicon solar cells

Date

2017
Proceedings Paper
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dc.contributor.authorDang Thi Thuy, Chi
dc.contributor.authorLabie, Riet
dc.contributor.authorSimoen, Eddy
dc.contributor.authorTous, Loic
dc.contributor.authorRussell, Richard
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorMertens, Robert
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorDang Thi Thuy, Chi
dc.contributor.imecauthorLabie, Riet
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorTous, Loic
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecTous, Loic::0000-0001-9928-7774
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-24T03:40:51Z
dc.date.available2021-10-24T03:40:51Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28090
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S1876610217341668
dc.source.beginpage862
dc.source.conference7th International Conference on Silicon Photovoltaics - SiliconPV
dc.source.conferencedate3/04/2017
dc.source.conferencelocationFreiburg Germany
dc.source.endpage868
dc.title

Insights into the reliability of Ni/Cu plated p-PERC silicon solar cells

dc.typeProceedings paper
dspace.entity.typePublication
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