Publication:
Test and Repair Improvements for UCIe
| dc.contributor.author | Wang, Tsung-Hsuan | |
| dc.contributor.author | Chuang, Po-Yao | |
| dc.contributor.author | Lorenzelli, Francesco | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Wang, Tsung-Hsuan | |
| dc.contributor.imecauthor | Chuang, Po-Yao | |
| dc.contributor.imecauthor | Lorenzelli, Francesco | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Chuang, Po-Yao::0000-0001-7325-8836 | |
| dc.contributor.orcidimec | Lorenzelli, Francesco::0000-0001-6465-7157 | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2025-05-13T12:15:36Z | |
| dc.date.available | 2024-08-23T17:30:07Z | |
| dc.date.available | 2025-05-13T12:15:36Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/ETS61313.2024.10567470 | |
| dc.identifier.eisbn | 979-8-3503-4932-0 | |
| dc.identifier.isbn | 979-8-3503-4933-7 | |
| dc.identifier.issn | 1530-1877 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44362 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE European Test Symposium (ETS) | |
| dc.source.conferencedate | MAY 20-24, 2024 | |
| dc.source.conferencelocation | Hague | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 6 | |
| dc.title | Test and Repair Improvements for UCIe | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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