Publication:

Minimizing junction damage associated with nickel silicide formation for the front side metallization of silicon solar cells

Date

2011
Proceedings Paper
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dc.contributor.authorTous, Loic
dc.contributor.authorvan Dorp, Dennis
dc.contributor.authorHernandez, Jose Luis
dc.contributor.authorAllebe, Christophe
dc.contributor.authorNgamo, Michel
dc.contributor.authorBender, Hugo
dc.contributor.authorMeersschaut, Johan
dc.contributor.authorAleman, Monica
dc.contributor.authorRussell, Richard
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorTous, Loic
dc.contributor.imecauthorvan Dorp, Dennis
dc.contributor.imecauthorHernandez, Jose Luis
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorAleman, Monica
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecTous, Loic::0000-0001-9928-7774
dc.contributor.orcidimecvan Dorp, Dennis::0000-0002-1085-4232
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-19T19:49:20Z
dc.date.available2021-10-19T19:49:20Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19907
dc.source.beginpage1210
dc.source.conference26th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC
dc.source.conferencedate5/09/2011
dc.source.conferencelocationHamburg Germany
dc.source.endpage1215
dc.title

Minimizing junction damage associated with nickel silicide formation for the front side metallization of silicon solar cells

dc.typeProceedings paper
dspace.entity.typePublication
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