Publication:

Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology

Date

2023
Proceedings Paper
https://doi.org/10.1109/IRPS48203.2023.10117773
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dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorVici, Andrea
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorVici, Andrea
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecVici, Andrea::0000-0002-3614-9590
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2023-11-22T11:06:10Z
dc.date.available2023-07-15T17:05:31Z
dc.date.available2023-11-22T11:06:10Z
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by the CyberSecurity Research Flanders with reference number VR20192203.
dc.identifier.doi10.1109/IRPS48203.2023.10117773
dc.identifier.eisbn978-1-6654-5672-2
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42154
dc.publisherIEEE
dc.source.conference61st IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 26-30, 2023
dc.source.conferencelocationMonterey
dc.source.journalna
dc.source.numberofpages6
dc.subject.keywordsVOLTAGE ACCELERATION
dc.subject.keywordsBREAKDOWN
dc.subject.keywordsTIME
dc.title

Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology

dc.typeProceedings paper
dspace.entity.typePublication
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