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Performance and reliability of ultra-thin HfO2-based RRAM (UTO-RRAM)
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Performance and reliability of ultra-thin HfO2-based RRAM (UTO-RRAM)
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Govoreanu, Bogdan
;
Ajaykumar, Arjun
;
Lipowicz, Hubert
;
Chen, Yangyin
;
Liu, Jen-Chieh
;
Degraeve, Robin
;
Zhang, Leqi
;
Clima, Sergiu
;
Goux, Ludovic
;
Radu, Iuliana
;
Fantini, Andrea
;
Raghavan, Naga
;
Kar, Gouri Sankar
;
Kim, Woosik
;
Redolfi, Augusto
;
Wouters, Dirk
;
Altimime, Laith
;
Jurczak, Gosia
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1998
since deposited on 2021-10-21
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last month
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last week
Acq. date: 2025-12-09
Citations
Metrics
Views
1998
since deposited on 2021-10-21
1
last month
1
last week
Acq. date: 2025-12-09
Citations