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A new method for quickly evaluating reversible and permanent components of the BTI degradation

Date

2018
Proceedings Paper
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dc.contributor.authorGarros, X.
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorReimbold, G.
dc.contributor.authorGaillard, F.
dc.contributor.authorDiouf, C.
dc.contributor.authorFederspiel, X.
dc.contributor.authorHuard, V.
dc.contributor.authorRafik, M.
dc.date.accessioned2021-10-25T18:54:36Z
dc.date.available2021-10-25T18:54:36Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30749
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353688
dc.source.beginpageP-RT.6
dc.source.conference2018 IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.title

A new method for quickly evaluating reversible and permanent components of the BTI degradation

dc.typeProceedings paper
dspace.entity.typePublication
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