Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Consistent model for short-channel nMOSFET post-hard-breakdown characteristics
Publication:
Consistent model for short-channel nMOSFET post-hard-breakdown characteristics
Copy permalink
Date
2001
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
De Keersgieter, An
;
Van de Mieroop, Koen
;
Bearda, Twan
;
Groeseneken, Guido
Journal
Abstract
Description
Metrics
Views
1878
since deposited on 2021-10-14
Acq. date: 2025-12-17
Citations
Metrics
Views
1878
since deposited on 2021-10-14
Acq. date: 2025-12-17
Citations