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A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices
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A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices
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Date
2010
Proceedings Paper
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20962.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sarkar, Deblina
;
Thijs, Steven
;
Linten, Dimitri
;
Russ, Christian
;
Gossner, Harald
;
Banerjee, Kaustav
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1943
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-12
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Metrics
Views
1943
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-12
Citations