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A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions

Date

1996
Journal article
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dc.contributor.authorDegraeve, Robin
dc.contributor.authorRoussel, Philippe
dc.contributor.authorOgier, Jean-Luc
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-29T14:25:34Z
dc.date.available2021-09-29T14:25:34Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1190
dc.source.beginpage1651
dc.source.endpage1654
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
dc.title

A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions

dc.typeJournal article
dspace.entity.typePublication
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