Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Behaviour of metallic contaminants during MOS processing
Publication:
Behaviour of metallic contaminants during MOS processing
Date
1998
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
2855.pdf
360.45 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bearda, Twan
;
De Gendt, Stefan
;
Loewenstein, Lee
;
Knotter, Martin
;
Mertens, Paul
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
1982
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1982
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations