Publication:

Extreme scaling enabled by MX2 transistors: variability challenges (invited)

Date

2021
Proceedings Paper
https://doi.org/10.1109/SNW51795.2021.00036
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dc.contributor.authorSmets, Quentin
dc.contributor.authorArutchelvan, Goutham
dc.contributor.authorSchram, Tom
dc.contributor.authorVerreck, Devin
dc.contributor.authorGroven, Benjamin
dc.contributor.authorCott, Daire
dc.contributor.authorAhmed, Zubair
dc.contributor.authorShi, Yuanyuan
dc.contributor.authorSutar, Surajit
dc.contributor.authorNalin Mehta, Ankit
dc.contributor.authorLin, Dennis
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorRadu, Iuliana
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorArutchelvan, Goutham
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorGroven, Benjamin
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorAhmed, Zubair
dc.contributor.imecauthorShi, Yuanyuan
dc.contributor.imecauthorSutar, Surajit
dc.contributor.imecauthorNalin Mehta, Ankit
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecGroven, Benjamin::0000-0002-5781-7594
dc.contributor.orcidimecAhmed, Zubair::0000-0002-8609-6298
dc.contributor.orcidimecShi, Yuanyuan::0000-0002-9154-1827
dc.contributor.orcidimecAsselberghs, Inge::0000-0001-8371-3222
dc.contributor.orcidimecRadu, Iuliana::0000-0002-6388-729X
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecShi, Yuanyuan::0000-0002-4836-6752
dc.contributor.orcidimecSutar, Surajit::0000-0003-3114-718X
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecNalin Mehta, Ankit::0000-0002-2169-940X
dc.date.accessioned2023-08-10T08:35:54Z
dc.date.available2023-06-20T10:36:52Z
dc.date.available2023-08-10T08:35:54Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.1109/SNW51795.2021.00036
dc.identifier.eisbn978-4-86348-781-9
dc.identifier.issn2161-4636
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41962
dc.publisherIEEE, ELECTRON DEVICES SOC & RELIABILITY GROUP
dc.source.beginpage69
dc.source.conference26th Silicon Nanoelectronics Workshop
dc.source.conferencedateJUN 13, 2021
dc.source.conferencelocationKyoto
dc.source.endpage70
dc.source.journalna
dc.source.numberofpages2
dc.title

Extreme scaling enabled by MX2 transistors: variability challenges (invited)

dc.typeProceedings paper
dspace.entity.typePublication
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