Publication:

Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space

Date

2019
Proceedings Paper
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dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorChuang, Kent
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorVan Beek, Simon
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-27T07:46:12Z
dc.date.available2021-10-27T07:46:12Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32623
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720592
dc.source.beginpage1
dc.source.conference2019 IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate30/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage6
dc.title

Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space

dc.typeProceedings paper
dspace.entity.typePublication
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