Publication:

A Wide-Range Body Biasing Technique for Analog ICs in 22nm FD-SOI Under Total Ionizing Dose Radiation Harsh Environment

Date

2024
Proceedings Paper
https://doi.org/10.1109/radecs61970.2024.11298604
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1740-1711
cris.virtualsource.departmentf00f253d-ca86-4aac-afa7-9f9514f86618
cris.virtualsource.orcidf00f253d-ca86-4aac-afa7-9f9514f86618
dc.contributor.authorZhao, Jinghao
dc.contributor.authorQing, Yihong
dc.contributor.authorLi, Zheyi
dc.contributor.authorGao, Bo
dc.contributor.authorPrinzie, Jeffrey
dc.contributor.authorSaigné, Frédéric
dc.contributor.authorLeroux, Paul
dc.date.accessioned2026-11-09T14:14:52Z
dc.date.available2026-11-09T14:14:52Z
dc.date.issued2024
dc.description.abstractThis paper presents a wide-range body biasing technique for enhancing total ionizing dose (TID) robustness of analog integrated circuits (ICs) in 22nm fully depleted silicon-on-insulator (FD-SOI). A precise SPICE model has been developed to predict the behavior of MOSFETs under TID degradation, based on experimental results from X-ray irradiation tests on a test vehicle fabricated in 22nm FD-SOI. From the simulation in an electronic design automation (EDA) tool, the performance of a bootstrap switch and operational amplifier (OPAMP) with the proposed body biasing configuration exhibit strong TID irradiation robustness.
dc.identifier.doi10.1109/radecs61970.2024.11298604
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/60777
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.beginpage1
dc.source.conference24th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
dc.source.conferencedate2024-09-16
dc.source.conferencelocationMaspalomas
dc.source.endpage4
dc.source.journal24th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
dc.source.numberofpages4
dc.title

A Wide-Range Body Biasing Technique for Analog ICs in 22nm FD-SOI Under Total Ionizing Dose Radiation Harsh Environment

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2025-12-24
imec.internal.sourcecrawler
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