Publication:
Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs
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1966 since deposited on 2021-10-16
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Acq. date: 2026-08-08
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Statistics
Views
1966 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-08-08
Citations