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In-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challenges
Publication:
In-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challenges
Date
2003
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Benedetti, Alessandro
;
Bender, Hugo
Journal
Abstract
Description
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2010
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2010
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations