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Exposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networks
Publication:
Exposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networks
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Date
2020
Proceedings Paper
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47528.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Velghe, Maarten
;
Shikhantsov, Sergei
;
Tanghe, Emmeric
;
Martens, Luc
;
Joseph, Wout
;
Thielens, Arno
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1955
since deposited on 2021-10-29
Acq. date: 2026-08-09
Citations
Statistics
Views
1955
since deposited on 2021-10-29
Acq. date: 2026-08-09
Citations