A simple characterization method for MOS transistor matching in deep submicron technologies

dc.contributor.author	Croon, Jeroen
dc.contributor.author	Rosmeulen, Maarten
dc.contributor.author	Decoutere, Stefaan
dc.contributor.author	Sansen, Willy
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Rosmeulen, Maarten
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Rosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned	2021-10-14T16:44:03Z
dc.date.available	2021-10-14T16:44:03Z
dc.date.issued	2001
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/5172
dc.source.beginpage	213
dc.source.conference	Proceedings IEEE 2001 International Conference on Microelectronic Test Structures;
dc.source.conferencelocation
dc.source.endpage	218
dc.title	A simple characterization method for MOS transistor matching in deep submicron technologies
dc.type	Proceedings paper
dspace.entity.type	Publication
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