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MTF test system with AC based dynamic joule correction for electromigration tests on interconnects

Date

2004
Journal article
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dc.contributor.authorBiesemans, L.
dc.contributor.authorSchepers, K.
dc.contributor.authorVanstreels, Kris
dc.contributor.authorD'Haen, Jan
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.imecauthorVanstreels, Kris
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.contributor.orcidimecVanstreels, Kris::0000-0002-4420-0966
dc.date.accessioned2021-10-15T12:44:01Z
dc.date.available2021-10-15T12:44:01Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8589
dc.source.beginpage1849
dc.source.endpage1854
dc.source.issue9_11
dc.source.journalMicroelectronics Reliability
dc.source.volume44
dc.title

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects

dc.typeJournal article
dspace.entity.typePublication
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