Publication:
Gate oxide breakdown in FET devices and circuits (Tutorial)
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-17T23:15:39Z | |
| dc.date.available | 2021-10-17T23:15:39Z | |
| dc.date.issued | 2009 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15556 | |
| dc.source.conference | 47th Annual IEEE International Reliability Physics Symposium | |
| dc.source.conferencedate | 26/04/2009 | |
| dc.source.conferencelocation | Montreal Canada | |
| dc.title | Gate oxide breakdown in FET devices and circuits (Tutorial) | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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