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Articles
Forward bias gate breakdown mechanism in enhancement-mode p-GaN gate AlGaN/GaN high-electron mobility transistors
Publication:
Forward bias gate breakdown mechanism in enhancement-mode p-GaN gate AlGaN/GaN high-electron mobility transistors
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Tian-Li
;
Marcon, Denis
;
You, Shuzhen
;
Posthuma, Niels
;
Bakeroot, Benoit
;
Stoffels, Steve
;
Van Hove, Marleen
;
Groeseneken, Guido
;
Decoutere, Stefaan
Journal
IEEE Electron Device Letters
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1940
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Acq. date: 2025-12-10
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Views
1940
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
Citations