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Impact of mask stack on high NA EUV imaging
Publication:
Impact of mask stack on high NA EUV imaging
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Philipsen, Vicky
;
Hendrickx, Eric
;
Jonckheere, Rik
;
Vandenberghe, Geert
;
Davydova, Natalia
;
Fliervoet, Timon
;
Neumann, Jens Timo
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1933
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-11
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Metrics
Views
1933
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-11
Citations