Publication:

Benchmarking time-dependent variability of junctionless nanowire FETs

Date

2017
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorRzepa, G.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWeckx, Pieter
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorBury, Erik
dc.contributor.authorSimicic, Marko
dc.contributor.authorRoussel, Philippe
dc.contributor.authorHellings, Geert
dc.contributor.authorVeloso, Anabela
dc.contributor.authorMatagne, Philippe
dc.contributor.authorGrasser, T.
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-24T06:28:38Z
dc.date.available2021-10-24T06:28:38Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28618
dc.source.beginpage2D-6.1
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage2D-6.7
dc.title

Benchmarking time-dependent variability of junctionless nanowire FETs

dc.typeProceedings paper
dspace.entity.typePublication
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