Low Frequency Noise: A Show Stopper for State-of-the-art and Future Si, Ge-based and III-V Technologies

dc.contributor.author	Claeys, C.
dc.contributor.author	Oliviera, A.
dc.contributor.author	He, L.
dc.contributor.author	Takakura, K.
dc.contributor.author	Veloso, Anabela
dc.contributor.author	Putcha, Vamsi
dc.contributor.author	Arimura, Hiroaki
dc.contributor.author	Simoen, Eddy
dc.contributor.imecauthor	Veloso, Anabela
dc.contributor.imecauthor	Putcha, Vamsi
dc.contributor.imecauthor	Arimura, Hiroaki
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Putcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-11-29T10:51:41Z
dc.date.available	2021-11-02T15:58:13Z
dc.date.available	2021-11-29T10:51:41Z
dc.date.issued	2021
dc.identifier.doi	10.1109/EDTM50988.2021.9420967
dc.identifier.eisbn	978-1-7281-8176-9
dc.identifier.issn	na
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/37668
dc.publisher	IEEE
dc.source.conference	5th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
dc.source.conferencedate	APR 08-11, 2021
dc.source.conferencelocation	Chengdu
dc.source.journal	na
dc.source.numberofpages	3
dc.subject.keywords	GATE METAL
dc.subject.keywords	TRANSISTOR
dc.subject.keywords	FETS
dc.title	Low Frequency Noise: A Show Stopper for State-of-the-art and Future Si, Ge-based and III-V Technologies
dc.type	Proceedings paper
dspace.entity.type	Publication
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