Publication:
A full-automatic test system for characterizing wide-I/O micro-bump probe cards
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Fodor, Ferenc | |
| dc.contributor.author | De Wachter, Bart | |
| dc.contributor.author | Kiesewetter, Joerg | |
| dc.contributor.author | Hill, Eric | |
| dc.contributor.author | Smith, Ken | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Fodor, Ferenc | |
| dc.contributor.imecauthor | De Wachter, Bart | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-24T08:47:28Z | |
| dc.date.available | 2021-10-24T08:47:28Z | |
| dc.date.issued | 2017-06 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28921 | |
| dc.identifier.url | http://www.swtest.org/swtw_library/2017proc/swtw2017.html | |
| dc.source.beginpage | 812 | |
| dc.source.conference | IEEE Semiconductor Wafer Test Workshop - SWTW | |
| dc.source.conferencedate | 4/06/2017 | |
| dc.source.conferencelocation | San Diego, CA USA | |
| dc.source.endpage | 848 | |
| dc.title | A full-automatic test system for characterizing wide-I/O micro-bump probe cards | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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