Radiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodes

dc.contributor.author	Ohyama, Hidenori
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.author	Takami, Y.
dc.contributor.author	Kudou, T.
dc.contributor.author	Sunaga, H.
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-01T08:36:05Z
dc.date.available	2021-10-01T08:36:05Z
dc.date.embargo	9999-12-31
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2826
dc.source.beginpage	108
dc.source.conference	Proceedings 4th European Conference on Radiation and its Effects on Components and Systems - RADECS
dc.source.conferencedate	15/09/1998
dc.source.conferencelocation	Cannes France
dc.source.endpage	113
dc.title	Radiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodes
dc.type	Proceedings paper
dspace.entity.type	Publication
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